Study of the effect of different aluminium surface pretreatments on the deposition of thin non-functional silane coatingsFRANQUET, A; TERRYN, H; VEREECKEN, J et al.Surface and interface analysis. 2004, Vol 36, Num 8, pp 681-684, issn 0142-2421, 4 p.Conference Paper

Accuracy of color determination from spectroscopic ellipsometry measurementsJOHS, Blaine; ARWIN, Hans; WANER, Thomas et al.Thin solid films. 2011, Vol 519, Num 9, pp 2711-2714, issn 0040-6090, 4 p.Conference Paper

Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin filmsCERQUEIRA, M. F; STEPIKHOVA, M; LOSURDO, M et al.Microelectronics journal. 2003, Vol 34, Num 5-8, pp 375-378, issn 0959-8324, 4 p.Conference Paper

Novel fast spectroscopic rotating-polarizer ellipsometerSTRAAIJER, A; VERBRUGGEN, M. H. W; DE NIJS, J. M. M et al.Review of scientific instruments. 1993, Vol 64, Num 6, pp 1468-1473, issn 0034-6748Article

Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometryNECAS, David; OHLIDAL, Ivan; FRANTA, Daniel et al.Thin solid films. 2014, Vol 571, pp 573-578, issn 0040-6090, 6 p., 3Conference Paper

Versatile transmission ellipsometry to study linear ferrofluid magneto-opticsKOOIJ, E. S; GALCA, A. C; POELSEMA, B et al.Journal of colloid and interface science. 2006, Vol 304, Num 1, pp 261-270, issn 0021-9797, 10 p.Article

Application of neural classification in ellipsometry for robust thin-film characterizationsGEREIGE, Issam; ROBERT, Stéphane.Thin solid films. 2010, Vol 518, Num 15, pp 4091-4094, issn 0040-6090, 4 p.Article

Ellipsometric study of Si_xC films: Analysis of Tauc―Lorentz and Gaussian oscillator modelsBUDAI, Judit; HANYECZ, István; SZILAGYI, Edit et al.Thin solid films. 2011, Vol 519, Num 9, pp 2985-2988, issn 0040-6090, 4 p.Conference Paper

In-situ monitoring of alkanethiol self-assembled monolayer chemisorption with combined spectroscopic ellipsometry and quartz crystal microbalance techniquesRODENHAUSEN, K. B; DUENSING, B. A; KASPUTIS, T et al.Thin solid films. 2011, Vol 519, Num 9, pp 2817-2820, issn 0040-6090, 4 p.Conference Paper

Rotatable broadband retarders for far-infrared spectroscopic ellipsometryKANG, T. D; STANDARD, E; CARR, G. L et al.Thin solid films. 2011, Vol 519, Num 9, pp 2698-2702, issn 0040-6090, 5 p.Conference Paper

Estimate of dielectric density using spectroscopic ellipsometryDAVEY, W; BUIU, O; WERNER, M et al.Microelectronic engineering. 2009, Vol 86, Num 7-9, pp 1905-1907, issn 0167-9317, 3 p.Conference Paper

Metal contamination detection in nickel induced crystallized silicon by spectroscopic ellipsometryPEREIRA, L; AGUAS, H; BECKERS, M et al.Journal of non-crystalline solids. 2008, Vol 354, Num 19-25, pp 2319-2323, issn 0022-3093, 5 p.Conference Paper

Total internal reflection ellipsometry of metalorganic compound structures modified with gold nanoparticlesBALEVICIUS, Z; DREVINSKAS, R; DAPKUS, M et al.Thin solid films. 2011, Vol 519, Num 9, pp 2959-2962, issn 0040-6090, 4 p.Conference Paper

In vitro characterization of optical property of mouse myoblast cells by spectroscopic ellipsometryYANG, S. M; CHOI, S. J; KIM, H. S et al.Thin solid films. 2014, Vol 571, pp 468-472, issn 0040-6090, 5 p., 3Conference Paper

Systematic combination of X-ray reflectometry and spectroscopic ellipsometry: A powerful technique for reliable in-fab metrologyNOLOT, E; ANDRE, A.Thin solid films. 2011, Vol 519, Num 9, pp 2782-2786, issn 0040-6090, 5 p.Conference Paper

Determination of accurate critical-point energies, linewidths and line shapes from spectroscopic ellipsometry dataGARLAND, J. W; KIM, C. C; ABAD, H et al.Thin solid films. 1993, Vol 233, Num 1-2, pp 148-152, issn 0040-6090Conference Paper

Improvement in accuracy of spectroscopic ir ellipsometry by the use of ir retardersRÖSELER, A; MOLGEDEY, W.Infrared physics. 1984, Vol 24, Num 1, pp 1-5, issn 0020-0891Article

Optical properties of hybrid polymers as barrier materialsGEORGIOU, D; LASKARAKIS, A; LOGOTHETIDIS, S et al.Applied surface science. 2009, Vol 255, Num 18, pp 8023-8029, issn 0169-4332, 7 p.Article

Cryogenic spectrometric ellipsometer for studding solid state optical propertiesBELYAEVA, A. I; GREBENNIK, T. G.SPIE proceedings series. 1998, pp 401-407, isbn 0-8194-2808-6Conference Paper

Effect of annealing on composition, structure and optical properties of SrHfON thin filmsFENG, Li-Ping; WANG, Yin-Quan; HAO TIAN et al.Applied surface science. 2012, Vol 258, Num 24, pp 9706-9710, issn 0169-4332, 5 p.Article

International Conference on Spectroscopic Ellipsometry (ICSE 4)ARWIN, Hans; BECK, Uwe; SCHUBERT, Matthias et al.Physica status solidi. A, Applications and materials science (Print). 2008, Vol 205, Num 4, pp 709-948, issn 1862-6300, 239 p.Conference Paper

Eine Anordnung zur spektrophotometrischen Ellipsometrie = Un montage pour l'ellipsométrie spectrophotométrique = A mounting for spectrophotometric ellipsometryABRAHAM, M; MAHMOUDI, A; TADJEDDINE, A et al.Experimentelle Technik der Physik. 1984, Vol 32, Num 5, pp 405-412, issn 0014-4924Article

What can Raman spectroscopy and spectroscopic ellipsometry bring for the characterisation of thin films and materials surface?LEWANDOWSKA, Renata; GAILLET, Mélanie; LE BOURDON, Gwénaëlle et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 588-592, issn 0142-2421, 5 p.Conference Paper

Spectroscopic ellipsometry (SE) studies on vacuum-evaporated ZnSe thin filmsVENKATACHALAM, S; SOUNDARARAJAN, D; PERANANTHAM, P et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 715-720, issn 1044-5803, 6 p.Conference Paper

A comparison of surface sensitive reflection spectroscopies : Linear optics at surfaces and interfacesROSEBURGH, D. S; COLE, R. J.Journal of physics. Condensed matter (Print). 2004, Vol 16, Num 39, pp S4279-S4288, issn 0953-8984Article